发明名称 PROGRAMMING TIME IMPROVEMENT FOR NON-VOLATILE MEMORY
摘要 Disclosed herein are techniques for providing a programming voltage to a selected word line in a non-volatile memory array. This may be a 3D NAND, 2D NAND, or another type of memory array. The programming voltage may be quickly ramped up on the selected word line, without the need for adding a stronger charge pump to the memory device. The voltage on the selected word line may be ramped up to a target voltage during a channel pre-charge phase. The target voltage may be limited in magnitude so that program disturb does not occur. Next, during a channel boosting phase, the unselected word lines are increased to a boosting voltage. The voltage on the selected word line is also increased during the boosting phase to a second target level. Then, the voltage on the selected word line is charged up from the second target level to a program voltage.
申请公布号 US2015103592(A1) 申请公布日期 2015.04.16
申请号 US201314051217 申请日期 2013.10.10
申请人 SanDisk Technologies Inc. 发明人 Miwa Hitoshi
分类号 G11C16/12;G11C16/34 主分类号 G11C16/12
代理机构 代理人
主权项 1. A method of operating non-volatile storage, comprising: applying a first voltage to unselected word lines during a channel pre-charge phase; applying a second voltage that is greater than the first voltage to a selected word line during the channel pre-charge phase; increasing the first voltage on the unselected word lines to a boosting voltage; increasing the second voltage on the selected word line to a third voltage that is greater than the boosting voltage; and increasing the third voltage to a program voltage on the selected word line while maintaining the boosting voltage on the unselected word lines.
地址 Plano TX US