发明名称 Layer stack
摘要 In one embodiment method, a first Ti based layer is deposited on the substrate. An intermediate Al based layer is deposited on the first layer, a second NiV based layer is deposited on the intermediate layer, and a third Ag based layer is deposited on the second layer. The layer stack is tempered in such a way that at least one inter-metallic phase is formed between at least two metals of the group containing Ti, Al, Ni and V.
申请公布号 US9006899(B2) 申请公布日期 2015.04.14
申请号 US201213716017 申请日期 2012.12.14
申请人 Infineon Technologies AG 发明人 Ganitzer Paul;Matoy Kurt;Sporn Martin;Harrison Mark
分类号 H01L23/48;H01L23/52;H01L29/40;H01L23/498;H01L21/02 主分类号 H01L23/48
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A layer stack, comprising: a first layer, wherein the first layer contains Ti and has a thickness in a range from 100 nm to 400 nm; an intermediate layer disposed over the first layer, wherein the intermediate layer contains Al and has a thickness in a range from 30 nm to 50 nm, wherein the Al is partly converted to an intermetallic phase with a metal from the group consisting of Ti, Ni and V; a second layer disposed over the intermediate layer, wherein the second layer contains NiV and has a thickness in a range from 200 nm to 400 nm; and a third layer disposed over the second layer, wherein the third layer contains Ag and has a thickness in a range from 200 nm to 600 nm.
地址 Neubiberg DE