发明名称 SURFACE CONDITION EVALUATION DEVICE AND SURFACE CONDITION EVALUATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a surface condition evaluation device and a surface condition evaluation method that can evaluate a surface condition of a fine area of a sample in a wide range.SOLUTION: According to an embodiment, a surface condition evaluation device including an imaging part and a processing part is provided. The imaging part images a first area and a second area of a sample having a surface including the first area where a plurality of droplets are provided and the second area where a plurality of droplets are provided. The processing part evaluates a condition of the surface according to comparison results of a first image of the first area and a second image of the second area imaged by the imaging part.
申请公布号 JP2015068708(A) 申请公布日期 2015.04.13
申请号 JP20130202508 申请日期 2013.09.27
申请人 TOSHIBA CORP 发明人 KANEMITSU SHINGO;SAKURAI HIDEAKI
分类号 G01N13/00 主分类号 G01N13/00
代理机构 代理人
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