发明名称 半導体装置
摘要 <p>A semiconductor device includes a plurality of memory cells and a sense amplifier circuit which further includes a plurality of elements such as MOS transistor formed in a well, wherein sensitive element, which are sensitive to dispersion of an impurity density in the well, is distanced from a boundary and are disposed in the center region of the well, while non-sensitive element is disposed in the peripheral region close to the boundary in the well. Since sensitive element requiring precise control of threshold voltage is disposed in the center region having uniform impurity density, and non-sensitive element allowing for less precise control of threshold voltage is disposed in the peripheral region suffering from uneven impurity density, it is possible to effectively use the overall area of the well and to thereby suppress an increase in the layout area of chips.</p>
申请公布号 JP5676075(B2) 申请公布日期 2015.02.25
申请号 JP20080293349 申请日期 2008.11.17
申请人 发明人
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
代理机构 代理人
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