发明名称 THREE-DIMENSIONAL SEMICONDUCTOR DEVICE, VARIABLE RESISTIVE MEMORY DEVICE INCLUDING THE SAME, AND METHOD OF MANUFACTURING THE SAME
摘要 A three-dimensional semiconductor device, a resistive variable memory device including the same, and a method of manufacturing the same are provided. The 3D semiconductor device includes a source formed of a first semiconductor material, a channel layer formed on the source and formed of the first semiconductor material, a lightly doped drain (LDD) region formed on the channel layer and formed of a second semiconductor material having a higher oxidation rate than that of the first semiconductor material, a drain formed on the LDD region and formed of the first semiconductor material, and a gate insulating layer formed on outer circumferences of the channel layer, the LDD region, and the drain.
申请公布号 US2015048293(A1) 申请公布日期 2015.02.19
申请号 US201314075910 申请日期 2013.11.08
申请人 SK HYNIX INC. 发明人 PARK Nam Kyun
分类号 H01L27/24;H01L29/66;H01L29/78 主分类号 H01L27/24
代理机构 代理人
主权项 1. A three-dimensional (3D) semiconductor device, comprising: a source formed of a first semiconductor material; a channel layer formed on the source and formed of the first semiconductor material; a lightly doped drain (LDD) region formed on the channel layer and formed of a second semiconductor material having a higher oxidation rate than that of the first semiconductor material; a drain formed on the LDD region and formed of the first semiconductor material; and a gate insulating layer formed on outer circumferences of the channel layer, the LDD region, and the drain.
地址 Gyeonggi-do KR