发明名称 |
THREE-DIMENSIONAL SEMICONDUCTOR DEVICE, VARIABLE RESISTIVE MEMORY DEVICE INCLUDING THE SAME, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A three-dimensional semiconductor device, a resistive variable memory device including the same, and a method of manufacturing the same are provided. The 3D semiconductor device includes a source formed of a first semiconductor material, a channel layer formed on the source and formed of the first semiconductor material, a lightly doped drain (LDD) region formed on the channel layer and formed of a second semiconductor material having a higher oxidation rate than that of the first semiconductor material, a drain formed on the LDD region and formed of the first semiconductor material, and a gate insulating layer formed on outer circumferences of the channel layer, the LDD region, and the drain. |
申请公布号 |
US2015048293(A1) |
申请公布日期 |
2015.02.19 |
申请号 |
US201314075910 |
申请日期 |
2013.11.08 |
申请人 |
SK HYNIX INC. |
发明人 |
PARK Nam Kyun |
分类号 |
H01L27/24;H01L29/66;H01L29/78 |
主分类号 |
H01L27/24 |
代理机构 |
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代理人 |
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主权项 |
1. A three-dimensional (3D) semiconductor device, comprising:
a source formed of a first semiconductor material; a channel layer formed on the source and formed of the first semiconductor material; a lightly doped drain (LDD) region formed on the channel layer and formed of a second semiconductor material having a higher oxidation rate than that of the first semiconductor material; a drain formed on the LDD region and formed of the first semiconductor material; and a gate insulating layer formed on outer circumferences of the channel layer, the LDD region, and the drain. |
地址 |
Gyeonggi-do KR |