发明名称 Thin film transistor and method for fabricating the same
摘要 <p>The disclosed thin film transistor includes a channel layer which includes zinc, nitrogen, and oxygen, an etch stop layer which is formed on the channel layer and includes fluorine, source and drain electrodes which are in contact with both sides of the channel layer, respectively, a gate electrode which is formed to correspond to the channel layer, and a gate insulation layer which is formed between the channel layer and the gate electrode.</p>
申请公布号 KR20150016789(A) 申请公布日期 2015.02.13
申请号 KR20130092667 申请日期 2013.08.05
申请人 发明人
分类号 H01L21/336;H01L29/786 主分类号 H01L21/336
代理机构 代理人
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