发明名称 |
IMAGING DEVICE AND OPERATION METHOD THEREOF |
摘要 |
Provided is an imaging device that can correct an output value of a pixel circuit. The imaging device includes a pixel circuit, a current detection circuit, an A/D converter, one or more memory circuit portions, and an arithmetic circuit portion. The pixel circuit includes a transistor, a charge accumulation portion, and a light-receiving element. The memory circuit portion includes a first look-up table, a second look-up table, and a region where image data output from the arithmetic circuit portion is stored. The first look-up table stores data of potentials of the charge accumulation portion, which depends on the intensity of light. The second look-up table stores output data of the transistor, which depends on the potentials of the charge accumulation portion. |
申请公布号 |
US2015034831(A1) |
申请公布日期 |
2015.02.05 |
申请号 |
US201414446911 |
申请日期 |
2014.07.30 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
MIYAKE Hiroyuki;SHISHIDO Hideaki |
分类号 |
G01T1/24;H01L27/146;G01T1/20;G01T1/208 |
主分类号 |
G01T1/24 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a pixel circuit comprising a transistor and a light-receiving element, wherein a gate of the transistor is electrically connected to a charge accumulation portion and a potential of the charge accumulation portion is determined according to intensity of light received by the light-receiving element; and a memory circuit portion comprising a first look-up table and a second look-up table, wherein the first look-up table is configured to store data of potentials of the charge accumulation portion, which depends on the intensity of light, and wherein the second look-up table is configured to store output data of the transistor, which depends on the potentials of the charge accumulation portion. |
地址 |
Atsugi-shi JP |