发明名称 PLANT MEASUREMENT PROCESSING APPARATUS, PLANT MEASUREMENT PROCESSING METHOD, AND PLANT MEASUREMENT PROCESSING PROGRAM
摘要 <p>PROBLEM TO BE SOLVED: To provide processing for measuring growth condition of plants without being affected by surrounding light environment and shadows of the plants.SOLUTION: The plant measurement processing is performed by configuration for making a computer execute a process of calculating position dependency of temperature change (temperature/time) in a cultivation space where plants are planted, and a process of defining an area in which temperature change is larger than that of a background area in which the plants are not panted in the cultivation space as a covered area for the plants based on the position dependency of temperature change.</p>
申请公布号 JP2015008699(A) 申请公布日期 2015.01.19
申请号 JP20130138120 申请日期 2013.07.01
申请人 HITACHI SOLUTIONS LTD 发明人 AOYANAGI YOSHIMITSU
分类号 A01G7/00 主分类号 A01G7/00
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