发明名称 DEVICE FOR INSPECTING THE SURFACE OF AN ELECTRICALLY CONDUCTIVE PART
摘要 The invention relates to a device (100; 500) for inspecting the surface of an electrically conductive part, including a plurality of Eddy current probes (330, 331, 332...) arranged on a convex surface of the device, and means for applying the probes against the surface to be inspected into which the device is inserted, characterized in that the probes (330, 331, 332...) are attached onto flexible blades (320, 321, 322...) each extending side by side in a longitudinal direction (L) of the device, wherein said application means include a deformable material (490), the compression of which, in the longitudinal direction (L), results in an expansion that is transverse to the longitudinal direction, said expansion deforming said blades (320, 321, 322...) such as to apply the probes (330, 331, 332...) against the surface.
申请公布号 WO2015004364(A1) 申请公布日期 2015.01.15
申请号 WO2014FR51618 申请日期 2014.06.26
申请人 SNECMA 发明人 CHATENET, LUC, HENRI
分类号 G01N27/90 主分类号 G01N27/90
代理机构 代理人
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