发明名称 |
Memory with isolation structure |
摘要 |
A recessed transistor construction is formed between a first access transistor construction and a second access transistor construction to provide isolation between the access transistor constructions of a memory device. In some embodiments, a gate of the recessed transistor construction is grounded. In an embodiment, the access transistor constructions are recess access transistors. In an embodiment, the memory device is a DRAM. In another embodiment, the memory device is a 4.5F2 DRAM cell. |
申请公布号 |
US8933508(B2) |
申请公布日期 |
2015.01.13 |
申请号 |
US201313799084 |
申请日期 |
2013.03.13 |
申请人 |
Micron Technology, Inc. |
发明人 |
Juengling Werner |
分类号 |
H01L29/94;H01L27/108 |
主分类号 |
H01L29/94 |
代理机构 |
Knobbe, Martens, Olson & Bear, LLP |
代理人 |
Knobbe, Martens, Olson & Bear, LLP |
主权项 |
1. An apparatus comprising:
a substrate having a doping concentration; a memory cell comprising a charge storage device and a recessed access device, wherein the recessed access device extends into the substrate and is configured to induce a first depletion region in the substrate; and an isolation structure configured to isolate the memory cell from an adjacent memory cell, wherein the apparatus is configured such that during operation the isolation structure receives a bias voltage that together with the doping concentration of the substrate induces a second depletion region in the substrate that merges with the first depletion region. |
地址 |
Boise ID US |