发明名称 |
SEMICONDUCTOR MEMORY APPARATUS AND FABRICATION METHOD THEREOF |
摘要 |
Semiconductor memory apparatus and a method of fabricating the same are provided. The semiconductor memory apparatus includes a semiconductor substrate in which a cell area and a peripheral area are defined, a plurality of pillars formed in the a cell area of the semiconductor substrate to a first depth, a stepped part formed in the peripheral area to a height corresponding to the first depth, a recessed part formed in the stepped part to a second depth, and a core switching device formed in the recessed part. |
申请公布号 |
US2014374692(A1) |
申请公布日期 |
2014.12.25 |
申请号 |
US201314050037 |
申请日期 |
2013.10.09 |
申请人 |
SK hynix Inc. |
发明人 |
RHO Dae Ho;KIM Jeong Tae;KIM Hyun Kyu |
分类号 |
H01L27/24;H01L45/00 |
主分类号 |
H01L27/24 |
代理机构 |
|
代理人 |
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主权项 |
1. A semiconductor memory apparatus, comprising:
a semiconductor substrate in which a cell area and a peripheral area are defined; a plurality of pillars formed in the cell area of the semiconductor substrate to a first depth; a stepped part formed in the peripheral area to a height substantially the same as the first depth; a recessed part formed in the stepped part to a second depth; and a core switching device formed in the recessed part. |
地址 |
Gyeonggi-do KR |