发明名称 LITHOGRAPHIC METHOD
摘要 A method of patterning lithographic substrates, the method comprising using a free electron laser to generate EUV radiation and delivering the EUV radiation to a lithographic apparatus which projects the EUV radiation onto lithographic substrates, wherein the method further comprises reducing fluctuations in the power of EUV radiation delivered to the lithographic substrates by using a feedback-based control loop to monitor the free electron laser and adjust operation of the free electron laser accordingly.
申请公布号 WO2014202585(A2) 申请公布日期 2014.12.24
申请号 WO2014EP62691 申请日期 2014.06.17
申请人 ASML NETHERLANDS B.V. 发明人 NIKIPELOV, ANDREY;FRIJNS, OLAV;DE VRIES, GOSSE;LOOPSTRA, ERIK;BANINE, VADIM;DE JAGER, PIETER;DONKER, RILPHO;NIENHUYS, HAN-KWANG;KRUIZINGA, BORGERT;ENGELEN, WOUTER;LUITEN, OTGER;AKKERMANS, JOHANNES;GRIMMINCK, LEONARDUS;LITVINENKO, VLADIMIR
分类号 H01S3/09 主分类号 H01S3/09
代理机构 代理人
主权项
地址
您可能感兴趣的专利