发明名称 POLISHING APPARATUS
摘要 A polishing apparatus has a polishing pad, a top ring for holding a semiconductor wafer, and a vertical movement mechanism operable to move the top ring in a vertical direction. The polishing apparatus also has a distance measuring sensor operable to detect a position of the top ring when a lower surface of the top ring is brought into contact with the polishing pad, and a controller operable to calculate an optimal position of the top ring to polish the semiconductor wafer based on the position detected by the distance measuring sensor. The vertical movement mechanism includes a ball screw mechanism operable to move the top ring to the optimal position.
申请公布号 US2014357164(A1) 申请公布日期 2014.12.04
申请号 US201414464130 申请日期 2014.08.20
申请人 EBARA CORPORATION 发明人 NABEYA Osamu;TOGAWA Tetsuji;FUKUSHIMA Makoto;YASUDA Hozumi
分类号 B24B37/32;B24B37/10 主分类号 B24B37/32
代理机构 代理人
主权项
地址 Tokyo JP