发明名称 |
Layout pattern modification method |
摘要 |
A method of layout pattern modification includes the following steps: step 1: performing an OPC process on a layout containing a plurality of square patterns to obtain a plurality of post-OPC patterns in correspondence with the plurality of square patterns; step 2: performing a manufacturing rule check on each of the plurality of post-OPC patterns to identify, from the plurality of post-OPC patterns, one or more post-OPC patterns violating the manufacturing rule; and step 3: rotating at least one of the one or more post-OPC patterns violating the manufacturing rule; and step 4: performing a manufacturing rule check on each of the rotated and non-rotated post-OPC patterns, if no post-OPC pattern violating the manufacturing rule is identified, finishing the process; otherwise, if one or more post-OPC patterns violating the manufacturing rule are identified, continuing to perform step 3 and step 4. |
申请公布号 |
US8898598(B1) |
申请公布日期 |
2014.11.25 |
申请号 |
US201314105689 |
申请日期 |
2013.12.13 |
申请人 |
Shanghai Huali Microelectronics Corporation |
发明人 |
Zhang Chenming;Chang HsuSheng;Wei Fang |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
Muncy, Geissler, Olds & Lowe, P.C. |
代理人 |
Muncy, Geissler, Olds & Lowe, P.C. |
主权项 |
1. A computer-implemented method of layout pattern modification, comprising the following steps:
step 1: performing, by a processor, an optical proximity correction (OPC) process on a layout containing a plurality of square patterns to obtain a plurality of post-OPC patterns in correspondence with the plurality of square patterns; step 2: performing, by the processor, a check of a manufacturing rule on each of the plurality of post-OPC patterns to identify, from the plurality of post-OPC patterns, one or more post-OPC patterns violating the manufacturing rule; step 3: rotating at least one of the one or more post-OPC patterns violating the manufacturing rule; and step 4: performing, by the processor, a check of the manufacturing rule on each of the rotated and non-rotated post-OPC patterns, if no post-OPC pattern violating the manufacturing rule is identified, finishing the OPC process; otherwise, if one or more post-OPC patterns violating the manufacturing rule are identified, continuing to perform step 3 and step 4. |
地址 |
Shanghai CN |