发明名称 Layout pattern modification method
摘要 A method of layout pattern modification includes the following steps: step 1: performing an OPC process on a layout containing a plurality of square patterns to obtain a plurality of post-OPC patterns in correspondence with the plurality of square patterns; step 2: performing a manufacturing rule check on each of the plurality of post-OPC patterns to identify, from the plurality of post-OPC patterns, one or more post-OPC patterns violating the manufacturing rule; and step 3: rotating at least one of the one or more post-OPC patterns violating the manufacturing rule; and step 4: performing a manufacturing rule check on each of the rotated and non-rotated post-OPC patterns, if no post-OPC pattern violating the manufacturing rule is identified, finishing the process; otherwise, if one or more post-OPC patterns violating the manufacturing rule are identified, continuing to perform step 3 and step 4.
申请公布号 US8898598(B1) 申请公布日期 2014.11.25
申请号 US201314105689 申请日期 2013.12.13
申请人 Shanghai Huali Microelectronics Corporation 发明人 Zhang Chenming;Chang HsuSheng;Wei Fang
分类号 G06F17/50 主分类号 G06F17/50
代理机构 Muncy, Geissler, Olds & Lowe, P.C. 代理人 Muncy, Geissler, Olds & Lowe, P.C.
主权项 1. A computer-implemented method of layout pattern modification, comprising the following steps: step 1: performing, by a processor, an optical proximity correction (OPC) process on a layout containing a plurality of square patterns to obtain a plurality of post-OPC patterns in correspondence with the plurality of square patterns; step 2: performing, by the processor, a check of a manufacturing rule on each of the plurality of post-OPC patterns to identify, from the plurality of post-OPC patterns, one or more post-OPC patterns violating the manufacturing rule; step 3: rotating at least one of the one or more post-OPC patterns violating the manufacturing rule; and step 4: performing, by the processor, a check of the manufacturing rule on each of the rotated and non-rotated post-OPC patterns, if no post-OPC pattern violating the manufacturing rule is identified, finishing the OPC process; otherwise, if one or more post-OPC patterns violating the manufacturing rule are identified, continuing to perform step 3 and step 4.
地址 Shanghai CN