发明名称 WRITE AND ERASE SCHEME FOR RESISTIVE MEMORY DEVICE
摘要 A method for programming a two terminal resistive memory device, the method includes applying a bias voltage to a first electrode of a resistive memory cell of the device; measuring a current flowing through the cell; and stopping the applying of the bias voltage if the measured current is equal to or greater than a predetermined value.
申请公布号 US2014328108(A1) 申请公布日期 2014.11.06
申请号 US201414332092 申请日期 2014.07.15
申请人 Crossbar, Inc. 发明人 NAZARIAN Hagop;JO Sung Hyun
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项 1. A device comprising: a resistive switching device comprising a first electrode, a second electrode, and a resistive switching media disposed between the first electrode and the second electrode, wherein metal particles from the first electrode are disposed within the resistive switching media, wherein the resistive switching device is characterized by at least a first resistive state or a second resistive state; and a first circuit coupled to the first electrode, wherein the first circuit is configured to initiate applying a first state voltage to the first electrode, wherein the first circuit is configured to monitor a first current flowing through the resistive switching device in response to the first state voltage, wherein the first circuit is configured to determine a first current change rate in response to the current flowing through the resistive switching device with respect to time, and wherein the first circuit is configured to terminate applying the first state voltage to the resistive switching device when the first current change rate achieves a specified relation with respect to a first threshold current change rate.
地址 Santa Clara CA US