发明名称 PROBE ASSEMBLY AND PROBE BASE PLATE
摘要 A probe assembly includes a wiring base plate arranged on a lower surface side of a reinforcing plate and a probe base plate arranged on a lower surface side of the wiring base plate. The probe base plate includes a plurality of probes on a lower surface thereof and a plurality of anchor portions on an upper surface thereof, respectively. The anchor portions are set so that a height of the anchor portion arranged at a center portion of the probe base plate may be greater than a height of the anchor portion located at a peripheral portion of the probe base plate. Between the respective anchor portions and the reinforcing plate are arranged a plurality of brace portions corresponding to the plurality of anchor portions and determining a space between the probe base plate and the wiring base plate together with the anchor portions.
申请公布号 US2014300383(A1) 申请公布日期 2014.10.09
申请号 US201414203285 申请日期 2014.03.10
申请人 Kabushiki Kaisha Nihon Micronics 发明人 NAKATA Yoshiro
分类号 G01R1/073 主分类号 G01R1/073
代理机构 代理人
主权项 1. A probe assembly comprising: a reinforcing plate; a wiring base plate arranged on a lower surface side of the reinforcing plate; a probe base plate having an upper surface and a lower surface, arranged on a lower surface side of the wiring base plate, including a plurality of probes formed on the lower surface of the probe base plate and a plurality of anchor portions formed on the upper surface of the probe base plate, respectively, and arranging the plurality of anchor portions so that a height of the anchor portion arranged at a center portion of the probe base plate may be greater than a height of the anchor portion located at a peripheral portion of the probe base plate in a planar view; an elastic connector arranged between the wiring base plate and the probe base plate and electrically connecting the wiring base plate to the plurality of probes; and a plurality of brace portions arranged between the plurality of anchor portions and the reinforcing plate to correspond to the plurality of anchor portions and determining a space between the probe base plate and the wiring base plate together with the plurality of anchor portions.
地址 Tokyo JP