发明名称 Semiconductor apparatus and electronic equipment
摘要 A method for manufacturing the semiconductor apparatus includes an anchor process of forming a barrier metal film and carrying out physical etching making use of sputter gas. The anchor process is carried out at the same time on a wire connected to the lower portion of a first aperture serving as a penetration connection hole and a wire connected to the lower portion of a second aperture serving as a connection hole having an aspect ratio different from the aspect ratio of the penetration connection hole. The first and second apertures are apertures created on a semiconductor substrate obtained by bonding first and second semiconductor substrates to each other. The present technology can be applied to the semiconductor apparatus such as a solid-state imaging apparatus.
申请公布号 US8853852(B2) 申请公布日期 2014.10.07
申请号 US201213671130 申请日期 2012.11.07
申请人 Sony Corporation 发明人 Hayashi Toshihiko
分类号 H01L21/02 主分类号 H01L21/02
代理机构 Sheridan Ross P.C. 代理人 Sheridan Ross P.C.
主权项 1. A method for manufacturing a semiconductor apparatus, comprising: a first process of forming a barrier metal film and carrying out physical etching making use of sputter gas to serve as a process to be carried out at the same time on wires connected to lower portions of first and second apertures created on a semiconductor substrate obtained by bonding first and second semiconductor substrates to each other to serve as first and second apertures having aspect ratios different from each other; and after forming a barrier metal layer and carrying out physical etching, carrying out a seed film formation process to form a seed layer on surfaces of the first and second apertures.
地址 JP