发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a high-performance junction FET at a high yield.SOLUTION: A method for manufacturing a junction field-effect transistor according to one embodiment comprises the steps: (a) forming an ntype source layer 3 on a surface of an ntype drift layer 2 formed on an ntype SiC substrate 1; (b) forming shallow grooves 4 disposed at intervals of a predetermined distance by etching the surface of the ntype drift layer 2 using, as a mask, a silicon oxide film 21 formed on the ntype drift layer 2 after the step (a); (c) forming an n-type counter doped layer 5 by doping parts of the ntype drift layer 2 located under shallow grooves 4 with nitrogen by means of a vertical ion implantation method after the step (b); (d) forming side wall spacers 6 on side walls of the silicon oxide film and the shallow grooves 4 after the step (c); and (e) forming a p-type gate layer 7 by doping parts of the ntype drift layer 2 located under the shallow grooves 4 with aluminum by means of the vertical ion implantation method after the step (d). |
申请公布号 |
JP2014183259(A) |
申请公布日期 |
2014.09.29 |
申请号 |
JP20130057949 |
申请日期 |
2013.03.21 |
申请人 |
RENESAS ELECTRONICS CORP |
发明人 |
KAGOTOSHI YASUAKI;ARAI KOICHI;YOKOYAMA NATSUKI;SHIMIZU HARUKA |
分类号 |
H01L21/337;H01L21/338;H01L29/808;H01L29/812 |
主分类号 |
H01L21/337 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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