发明名称 Method and system for ultra miniaturized packages for transient voltage suppressors
摘要 A method of forming a silicon carbide transient voltage suppressor (TVS) assembly and a system for a transient voltage suppressor (TVS) assembly are provided. The transient voltage suppressor (TVS) assembly includes a semiconductor die including a contact surface on a single side of the die, the die further including a substrate comprising a layer of at least one of an electrical insulator material, a semi-insulating material, and a first wide band gap semiconductor having a conductivity of a first polarity, at least a TVS device including a plurality of wide band gap semiconductor layers formed on the substrate; a first electrode coupled in electrical contact with the TVS device and extending to the contact surface, and a second electrode electrically coupled to the substrate extending to the contact surface.
申请公布号 US8835976(B2) 申请公布日期 2014.09.16
申请号 US201213420056 申请日期 2012.03.14
申请人 General Electric Company 发明人 Kashyap Avinash Srikrishnan;Andarawis Emad Andarawis;Shaddock David Mulford
分类号 H01L29/66;H01L21/332 主分类号 H01L29/66
代理机构 代理人 Darling John P.
主权项 1. A transient voltage suppressor (TVS) assembly having a semiconductor die comprising a contact surface on a single side of said die, said die further comprising: a substrate comprising a layer of at least one of an electrical insulator material, a semi-insulating material, and a first wide band gap semiconductor having a conductivity of a first polarity; at least a TVS device comprising a plurality of wide band gap semiconductor layers formed on said substrate; a first electrode coupled in electrical contact with said TVS device and extending to said contact surface; a second electrode electrically coupled to said substrate extending to said contact surface, further comprising a beveled sidewall forming an angle of approximately five degrees to approximately ninety degrees with respect to an interface between adjacent contacting layers; a second layer of the first wide band gap semiconductor or a second wide band gap semiconductor having a conductivity of a second polarity coupled in electrical contact with said substrate, the second polarity being different than the first polarity; and a third layer of the first, the second, or a third wide band gap semiconductor having a conductivity of the first polarity coupled in electrical contact with said second layer, said second layer having a conductivity of the second polarity is lightly doped relative to the layers having a conductivity of the first polarity.
地址 Niskayuna NY US