发明名称 Wiring board and probe card using the same
摘要 A wiring board and a probe card using the wiring board which respond to a demand for improving electrical reliability.
申请公布号 US8836361(B2) 申请公布日期 2014.09.16
申请号 US201313774851 申请日期 2013.02.22
申请人 KYOCERA SLC Technologies Corporation 发明人 Taguchi Takayuki;Terada Kenji
分类号 G01R31/20;G01R1/073 主分类号 G01R31/20
代理机构 Procopio, Cory, Hargreaves & Savitch LLP 代理人 Procopio, Cory, Hargreaves & Savitch LLP
主权项 1. A wiring board comprising: a core substrate; and a buildup layer formed on the core substrate, wherein the buildup layer includes: a plurality of resin layers laminated on the core substrate;a plurality of pads formed on a topmost layer of the resin layers and to which a plurality of probes are respectively connected;a plurality of wiring conductors formed on either the resin layers or the core substrate and electrically connecting the plurality of pads individually to an external circuit;a via conductor penetrating through the resin layer in a thickness direction thereof and electrically connecting the pad and the wiring conductor together; anda dummy via conductor penetrating through the resin layer in the thickness direction thereof without electrically connecting the pad and the wiring conductor together, wherein the via conductor and the dummy via conductor are arranged immediately below each of the pads, the pads include a first pad with at least one of the dummy via conductors arranged immediately therebelow, and a second pad with only the via conductor arranged immediately therebelow, and wherein a total amount of the dummy via conductors and a quantity of the via conductors formed immediately below the first pad is equal to an amount of the via conductors formed immediately below the second pad.
地址 Yasu-shi, Shiga JP