发明名称 Method and apparatus for detection of lead conductor anomalies using dynamic electrical parameters
摘要 A method and apparatus to detect anomalies in the conductors of leads attached to implantable medical devices based on the dynamical electrical changes these anomalies cause. In one embodiment, impedance is measured for weak input signals of different applied frequencies, and a conductor anomaly is detected based on differences in impedance measured at different frequencies. In another embodiment, a transient input signal is applied to the conductor, and an anomaly is identified based on parameters related to the time course of the voltage or current response, which is altered by anomaly-related changes in capacitance and inductance, even if resistance is unchanged. The method may be implemented in the implantable medical device or in a programmer used for testing leads.
申请公布号 US8825158(B2) 申请公布日期 2014.09.02
申请号 US201012868056 申请日期 2010.08.25
申请人 Lamda Nu, LLC 发明人 Swerdlow Charles
分类号 A61N1/08 主分类号 A61N1/08
代理机构 Patterson Thuente Pedersen, P.A. 代理人 Patterson Thuente Pedersen, P.A.
主权项 1. A method for determination of anomalies in a lead implanted within a patient, the method comprising the steps of: a. delivering one or more signals at a subset of frequencies to one or more conductors in the implanted lead, b. measuring two or more frequency dependent parameters determined by inductance or capacitance of the implanted lead, c. determining at least one relationship between two or more measured parameters, d. comparing the at least one relationship to a predetermined expected range of relationships, and e. detecting an anomaly in the implanted lead based on a change between the determined and expected relationships, wherein the anomaly can be any of a partial conductor fracture, a complete conductor fracture, a partial insulation failure, and a complete insulation failure.
地址 Orono MN US
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