发明名称 Method for fabricating a semiconductor component based on GaN
摘要 A semiconductor component has a plurality of GaN-based layers, which are preferably used to generate radiation, produced in a fabrication process. In the process, the plurality of GaN-based layers are applied to a composite substrate that includes a substrate body and an interlayer. A coefficient of thermal expansion of the substrate body is similar to or preferably greater than the coefficient of thermal expansion of the GaN-based layers, and the GaN-based layers are deposited on the interlayer. The interlayer and the substrate body are preferably joined by a wafer bonding process.
申请公布号 US8809086(B2) 申请公布日期 2014.08.19
申请号 US201213398425 申请日期 2012.02.16
申请人 OSRAM GmbH 发明人 Bader Stefan;Eisert Dominik;Hahn Berthold;Härle Volker
分类号 H01L21/20 主分类号 H01L21/20
代理机构 Cozen O'Connor 代理人 Cozen O'Connor
主权项 1. A thin-film light emitting-diode comprising: a carrier comprising germanium; GaN-based layers comprising an active layer sequence for emitting radiation, wherein an outer surface of the GaN-based layers is roughened; a reflector configured to reflect the radiation emitted by the active layer sequence, wherein a contact layer is arranged between the reflector and the GaN-based layers; and a contact surface configured to contact-connect the active layer sequence, wherein the reflector is arranged between the carrier and the GaN-based layers; and wherein the contact surface is applied to the GaN-based layers on a side of the GaN-based layers which faces away from the carrier.
地址 Munich DE
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