发明名称 |
Method for fabricating a semiconductor component based on GaN |
摘要 |
A semiconductor component has a plurality of GaN-based layers, which are preferably used to generate radiation, produced in a fabrication process. In the process, the plurality of GaN-based layers are applied to a composite substrate that includes a substrate body and an interlayer. A coefficient of thermal expansion of the substrate body is similar to or preferably greater than the coefficient of thermal expansion of the GaN-based layers, and the GaN-based layers are deposited on the interlayer. The interlayer and the substrate body are preferably joined by a wafer bonding process. |
申请公布号 |
US8809086(B2) |
申请公布日期 |
2014.08.19 |
申请号 |
US201213398425 |
申请日期 |
2012.02.16 |
申请人 |
OSRAM GmbH |
发明人 |
Bader Stefan;Eisert Dominik;Hahn Berthold;Härle Volker |
分类号 |
H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
Cozen O'Connor |
代理人 |
Cozen O'Connor |
主权项 |
1. A thin-film light emitting-diode comprising:
a carrier comprising germanium; GaN-based layers comprising an active layer sequence for emitting radiation, wherein an outer surface of the GaN-based layers is roughened; a reflector configured to reflect the radiation emitted by the active layer sequence, wherein a contact layer is arranged between the reflector and the GaN-based layers; and a contact surface configured to contact-connect the active layer sequence, wherein the reflector is arranged between the carrier and the GaN-based layers; and wherein the contact surface is applied to the GaN-based layers on a side of the GaN-based layers which faces away from the carrier. |
地址 |
Munich DE |