发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory device capable of accurately changing a resistance value of a variable resistive element.SOLUTION: When a plurality of variable resistive elements connected to a selected first wire are selected, a control circuit executes a reading operation of detecting a voltage of the selected first wire. The control circuit adjusts a voltage applied to the first wire selected in a reset operation or a set operation based on the voltage of the first wire detected and selected by the reading operation. The reset operation is an operation of increasing a resistance value of the variable resistive element. The set operation is an operation of lowering the resistance value of the variable resistive element.
申请公布号 JP2014146406(A) 申请公布日期 2014.08.14
申请号 JP20130151326 申请日期 2013.07.22
申请人 TOSHIBA CORP 发明人 SUGANO YUJI;MINEMURA YOICHI;TSUKAMOTO TAKAYUKI
分类号 G11C13/00 主分类号 G11C13/00
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