| 发明名称 |
WRAPPER CELL FOR DELAY TESTING OF TSV AND I/O PAD |
| 摘要 |
The present invention relates to a wrapper cell for a TSV failure test. The input wrapper cell includes a path which applies an output value of a test output port to an input pad according to a pad test signal so as to test a transition delay due to cracks of an I/O pad and a TSV. |
| 申请公布号 |
KR101429583(B1) |
申请公布日期 |
2014.08.13 |
| 申请号 |
KR20130017210 |
申请日期 |
2013.02.18 |
| 申请人 |
INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS |
发明人 |
PARK, SUNG JU;JUNG, JI HUN |
| 分类号 |
G01R31/3183;G01R31/02 |
主分类号 |
G01R31/3183 |
| 代理机构 |
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