发明名称 ADJUSTABLE PHOTON DETECTION SYSTEMS FOR MULTI-SLICE X-RAY COMPUTED TOMOGRAPHY SYSTEMS
摘要 An Adjustable Photon Detection System (APDS) for multi-slice X-ray CT systems and a multi-slice X-ray CT system using the APDS are disclosed; wherein the APDS can be adjusted to be aligned to different X-ray source positions; wherein the multi-slice X-ray CT system comprises one or more X-ray sources, and one or more APDS; wherein the multi-slice X-ray CT system may also include a detector position calculator for calculating effective detector positions and a detector position corrector for correcting projection data using calculated effective detector positions.
申请公布号 US2014219415(A1) 申请公布日期 2014.08.07
申请号 US201313760127 申请日期 2013.02.06
申请人 Ying Zhengrong 发明人 Ying Zhengrong
分类号 G01N23/04;G01T1/20 主分类号 G01N23/04
代理机构 代理人
主权项 1. An Adjustable Photon Detection System (APDS) for a multi-slice X-ray Computed Tomography (CT) system, wherein said X-ray CT system includes at least one X-ray source, comprising: A. A plurality of X-ray detector modules for receiving and converting X-ray photons; B. A support structure for mounting said X-ray detector modules, wherein said detector modules focus on a first position; and, C. A plurality of anti-scatter plates, placed on top of said detector modules; wherein said anti-scatter plates are aligned to a second position; wherein said second position may be different from said first position.
地址 Belmont MA US