发明名称 SiC SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To achieve a 4H-SiC/SiOinsulating film interface having a high mobility, and to improve element characteristics.SOLUTION: An SiC semiconductor device using a 4H-SiC substrate, comprises: a p-type 4H-SiC region 121 formed to at least a part of a surface part of SiC substrates 100 and 102; a defect reduction layer 124 by carbon doping formed on a surface part of the 4H-SiC region 121; a pair structure insulating film 125 formed by doping the n-type impurity on the defect reduction layer 124, and having a pn-doped pair at one Si lattice point; a gate insulating film 130 formed on the pair structure insulating film 125; and a gate electrode 140 formed on the gate insulating film 130.
申请公布号 JP2014143248(A) 申请公布日期 2014.08.07
申请号 JP20130009517 申请日期 2013.01.22
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 SHIMIZU TATSUO;HATAKEYAMA TETSUO
分类号 H01L29/78;H01L21/28;H01L21/316;H01L21/336;H01L27/04;H01L29/12 主分类号 H01L29/78
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