发明名称 |
SiC SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To achieve a 4H-SiC/SiOinsulating film interface having a high mobility, and to improve element characteristics.SOLUTION: An SiC semiconductor device using a 4H-SiC substrate, comprises: a p-type 4H-SiC region 121 formed to at least a part of a surface part of SiC substrates 100 and 102; a defect reduction layer 124 by carbon doping formed on a surface part of the 4H-SiC region 121; a pair structure insulating film 125 formed by doping the n-type impurity on the defect reduction layer 124, and having a pn-doped pair at one Si lattice point; a gate insulating film 130 formed on the pair structure insulating film 125; and a gate electrode 140 formed on the gate insulating film 130. |
申请公布号 |
JP2014143248(A) |
申请公布日期 |
2014.08.07 |
申请号 |
JP20130009517 |
申请日期 |
2013.01.22 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
SHIMIZU TATSUO;HATAKEYAMA TETSUO |
分类号 |
H01L29/78;H01L21/28;H01L21/316;H01L21/336;H01L27/04;H01L29/12 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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