发明名称 |
DEPOSITION DEVICE, SUBSTRATE PROCESSING DEVICE AND DEPOSITION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To perform a plasma modification treatment achieving high uniformity in a direction of a depth of a recess on a substrate surface when performing a deposition process by using a process gas to a substrate which orbits by a rotary table.SOLUTION: A deposition device comprises: a plasma treatment part 80 which is arranged at a distance from each of process gas nozzles 31, 32 in a rotation direction of a rotary table 2; and a bias electrode part 120 arranged at a position facing the plasma treatment part 80 across the rotary table 2 so as not to contact the rotary table 2. A bias voltage is applied from a bias voltage application part 128 to the bias electrode part 120 thereby to apply the bias voltage to a wafer W on the rotary table 2 in a non-contact manner. |
申请公布号 |
JP2014135464(A) |
申请公布日期 |
2014.07.24 |
申请号 |
JP20130066665 |
申请日期 |
2013.03.27 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
KATO HISASHI;KOBAYASHI TAKESHI;MIURA SHIGEHIRO;YAMAWAKI JUN;KOSHIMIZU CHISHIO;TACHIBANA MITSUHIRO;KIMURA TAKAFUMI |
分类号 |
H01L21/205;C23C16/505 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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