发明名称 DEPOSITION DEVICE, SUBSTRATE PROCESSING DEVICE AND DEPOSITION METHOD
摘要 PROBLEM TO BE SOLVED: To perform a plasma modification treatment achieving high uniformity in a direction of a depth of a recess on a substrate surface when performing a deposition process by using a process gas to a substrate which orbits by a rotary table.SOLUTION: A deposition device comprises: a plasma treatment part 80 which is arranged at a distance from each of process gas nozzles 31, 32 in a rotation direction of a rotary table 2; and a bias electrode part 120 arranged at a position facing the plasma treatment part 80 across the rotary table 2 so as not to contact the rotary table 2. A bias voltage is applied from a bias voltage application part 128 to the bias electrode part 120 thereby to apply the bias voltage to a wafer W on the rotary table 2 in a non-contact manner.
申请公布号 JP2014135464(A) 申请公布日期 2014.07.24
申请号 JP20130066665 申请日期 2013.03.27
申请人 TOKYO ELECTRON LTD 发明人 KATO HISASHI;KOBAYASHI TAKESHI;MIURA SHIGEHIRO;YAMAWAKI JUN;KOSHIMIZU CHISHIO;TACHIBANA MITSUHIRO;KIMURA TAKAFUMI
分类号 H01L21/205;C23C16/505 主分类号 H01L21/205
代理机构 代理人
主权项
地址