| 发明名称 | Semiconductor device having a plurality of pads | ||
| 摘要 | A semiconductor device includes a plurality of sensor pads configured to receive a probe signal from a testing apparatus, and a plurality of normal pads configured to receive a driving signal to drive the semiconductor device. In the plurality of sensor pads and the plurality of normal pads, a length in a direction corresponding to one of progress directions of a plurality of needles of the testing apparatus is longer than a length in another progress direction of the plurality of needles. | ||
| 申请公布号 | US8786303(B2) | 申请公布日期 | 2014.07.22 |
| 申请号 | US201012858673 | 申请日期 | 2010.08.18 |
| 申请人 | Samsung Electronics Co., Ltd. | 发明人 | Kim Kab Yong;Jang Hyun Soon;Jeong Yong Hwan |
| 分类号 | G01R1/067;G01R31/28 | 主分类号 | G01R1/067 |
| 代理机构 | Lee & Morse, P.C. | 代理人 | Lee & Morse, P.C. |
| 主权项 | 1. A semiconductor device having a plurality of pads, the semiconductor device comprising: a plurality of sensor pads configured to receive a probe signal from a testing apparatus; and a plurality of normal pads configured to receive a driving signal to drive the semiconductor device, wherein the plurality of sensor pads and the plurality of normal pads include individual sensor pads and normal pads that each have a length in a direction corresponding to one of progress directions of a plurality of needles of the testing apparatus that is longer than a length in another progress direction of the plurality of needles. | ||
| 地址 | Suwon-si, Gyeonggi-do KR | ||