发明名称 Compound semiconductor device and manufacturing method therefor
摘要 An HEMT includes, on an SiC substrate (1), a compound semiconductor layer (2), a silicon nitride (SiN) protective film (6) having an opening (6b) and covering the compound semiconductor layer, and a gate electrode (7) formed on the compound semiconductor layer so as to plug the opening. In the protective film, a projecting portion projecting from a side surface of the opening is formed at a lower layer portion (6a).
申请公布号 EP2575179(A3) 申请公布日期 2014.07.16
申请号 EP20120177567 申请日期 2012.07.24
申请人 FUJITSU LIMITED 发明人 MAKIYAMA, KOZO;OKAMOTO, NAOYA;OHKI, TOSHIHIRO;MINOURA, YUICHI;OZAKI, SHIROU;MIYAJIMA, TOYOO
分类号 H01L29/778;H01L29/66 主分类号 H01L29/778
代理机构 代理人
主权项
地址