发明名称 METHOD FOR PREPARING THIN SECTION OF FRAGILE SAMPLE BY DRY POLISHING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a thin section used for a scanning electron microscope, an energy dispersive x-ray spectroscopy, an electron probe microanalyzer, a reflecting microscope and the like for which a thin section with a highly smooth surface is required, for a fragile sample which is heat sensitive, or swells and is damaged in water or oil, and is made of natural minerals such as pumice stones, clay, diatom earth, manganese nodules, non-mineralized fossils and minerals containing sulfur and salt.SOLUTION: A fragile sample is embedded with a resin and solidified, and molded and cut into a rectangular parallelepiped shape. Thereafter, rock or mineral is attached to four surfaces of the sample orthogonal to a surface to be polished or to five surfaces in which a surface opposite to the one surface to be polished is added to the four surfaces, and then the surface is polished. This enables the surface to be polished while flatness is maintained and thickness of a thin section is judged. For the resin for the embedding and solidifying, a resin curable at room temperature or low temperature and having a short solidifying time is used, and in a final polishing step for the fragile sample, silk cloth having alumina powder impregnated therein is used.</p>
申请公布号 JP2014126546(A) 申请公布日期 2014.07.07
申请号 JP20120286077 申请日期 2012.12.27
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 OWADA AKIRA;SATO TAKUMI;HIRABAYASHI ERI;NAGAYOSHI KEIKO;SUZUKI MASAYA
分类号 G01N1/28;G01N1/36;G01N23/225 主分类号 G01N1/28
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