发明名称 |
PHASE-CHANGE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>The present invention relates to a phase-change memory device and a manufacturing method thereof. The phase-change memory device according to the present invention comprises a first phase-change memory layer including a first lower electrode structure formed on the upper part of a semiconductor substrate; a first phase-change film formed on the upper part of the first lower electrode structure; a first upper electrode surrounding both sidewalls of the first phase-change film; and a second upper electrode formed on the upper part of the first phase-change film.</p> |
申请公布号 |
KR20140084762(A) |
申请公布日期 |
2014.07.07 |
申请号 |
KR20120154595 |
申请日期 |
2012.12.27 |
申请人 |
SK HYNIX INC. |
发明人 |
RHO, DAE HO;KIM, JEONG TAE;CHO, BYUNG JICK |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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