发明名称 PHASE-CHANGE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>The present invention relates to a phase-change memory device and a manufacturing method thereof. The phase-change memory device according to the present invention comprises a first phase-change memory layer including a first lower electrode structure formed on the upper part of a semiconductor substrate; a first phase-change film formed on the upper part of the first lower electrode structure; a first upper electrode surrounding both sidewalls of the first phase-change film; and a second upper electrode formed on the upper part of the first phase-change film.</p>
申请公布号 KR20140084762(A) 申请公布日期 2014.07.07
申请号 KR20120154595 申请日期 2012.12.27
申请人 SK HYNIX INC. 发明人 RHO, DAE HO;KIM, JEONG TAE;CHO, BYUNG JICK
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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