发明名称 Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions
摘要 An electrical device in which an interface layer comprising arsenic is disposed between and in contact with a conductor and a semiconductor. In some cases, the interface layer may be a monolayer of arsenic.
申请公布号 US8766336(B2) 申请公布日期 2014.07.01
申请号 US201213687907 申请日期 2012.11.28
申请人 Acorn Technologies, Inc. 发明人 Grupp Daniel E.;Connelly Daniel J.
分类号 H01L29/78 主分类号 H01L29/78
代理机构 Ascenda Law Group, PC 代理人 Ascenda Law Group, PC
主权项 1. An electrical junction comprising an interface layer disposed between a contact metal and a group IV semiconductor, the semiconductor comprising a source or drain of a transistor, the interface layer comprising a metal oxide and configured to reduce a height of a Schottky barrier between the contact metal and the semiconductor from that which would exist at a contact junction between the contact metal and the semiconductor without the interface layer disposed therebetween, and wherein the electrical junction has a specific contact resistance of less than or equal to approximately 10 Ω-μm2.
地址 La Jolla CA US