发明名称 |
Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions |
摘要 |
An electrical device in which an interface layer comprising arsenic is disposed between and in contact with a conductor and a semiconductor. In some cases, the interface layer may be a monolayer of arsenic. |
申请公布号 |
US8766336(B2) |
申请公布日期 |
2014.07.01 |
申请号 |
US201213687907 |
申请日期 |
2012.11.28 |
申请人 |
Acorn Technologies, Inc. |
发明人 |
Grupp Daniel E.;Connelly Daniel J. |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
Ascenda Law Group, PC |
代理人 |
Ascenda Law Group, PC |
主权项 |
1. An electrical junction comprising an interface layer disposed between a contact metal and a group IV semiconductor, the semiconductor comprising a source or drain of a transistor, the interface layer comprising a metal oxide and configured to reduce a height of a Schottky barrier between the contact metal and the semiconductor from that which would exist at a contact junction between the contact metal and the semiconductor without the interface layer disposed therebetween, and wherein the electrical junction has a specific contact resistance of less than or equal to approximately 10 Ω-μm2. |
地址 |
La Jolla CA US |