JUNCTION BOX AND METHOD OF DIAGNOSING THE JUNCTION BOX

摘要

Disclosed are a junction box and a junction box fault diagnosis method. The junction box comprises a semiconductor unit for output (Intelligent Power Switch: IPS), an output detection unit, and a MICOM unit. The semiconductor unit for output supplies power to a load and measures a current value proportional to a current outputted to the load and a voltage value proportional to a voltage outputted to the load. The MICOM unit determines whether the semiconductor for output is out of order according to a control signal outputted to the semiconductor for output and the measured current value and voltage value. The failure in the semiconductor for output (IPS) within the junction box can be accurately determined by detecting the voltage value in the semiconductor for output and using information about whether the power is actually supplied to the load.