发明名称 |
Solid state lighting element, peak wavelength estimation method and binning method |
摘要 |
<p>Disclosed is a method of estimating a peak wavelength of a solid state lighting element, the method comprising determining (330) a thermal admittance spectrum of the solid state lighting element, said spectrum identifying the energy levels of the trap states in the band gap of the solid state lighting element; identifying (350) the shallow trap states in said spectrum; and estimating (370) said peak wavelength from the respective energy gaps between the identified shallow trap states and the band gap boundary. A binning method for characterizing solid state lighting elements utilizing this estimation method and a solid state lighting element adapted to implement this estimation method are also disclosed.</p> |
申请公布号 |
EP2746792(A1) |
申请公布日期 |
2014.06.25 |
申请号 |
EP20120198633 |
申请日期 |
2012.12.20 |
申请人 |
NXP B.V. |
发明人 |
SURDEANU, RADU;BUSCEMA, MICHELE;COX, MATTHIJS;KOENDERINK, FEMIUS |
分类号 |
G01R31/26;H01L21/66;H01S5/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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