发明名称 Method and apparatus for diagnosing a fault of a memory using interim time after execution of an application
摘要 An area of a memory has a diagnosis area and a non diagnosis area, with the diagnosis area divided into a plurality of Row areas which do not overlap each other, and each of the Row areas is divided into a plurality of Cell areas which do not overlap each other. A memory fault diagnostic method has a diagnostic step in a Row area to diagnose between Cell areas with respect to all the combinations of a set of Cell areas in the Row area, and a diagnostic step between Row areas to diagnose between Row areas with respect to all the combinations of a set of Row areas in the diagnosis area. A Row area size is determined to be a size in which a time of the diagnosis in a Row area becomes equal to a time of the diagnosis between Row areas.
申请公布号 US8762926(B2) 申请公布日期 2014.06.24
申请号 US201313754444 申请日期 2013.01.30
申请人 Kabushiki Kaisha Toshiba 发明人 Nakatani Hiroshi;Ohnishi Naoya;Amaki Satoru;Sameda Yoshito;Toko Makoto
分类号 G06F17/50 主分类号 G06F17/50
代理机构 Holtz, Holtz, Goodman & Chick PC 代理人 Holtz, Holtz, Goodman & Chick PC
主权项 1. A memory fault diagnostic method to diagnose a fault of a memory using an interim time after execution of an application in a predetermined control cycle, wherein: an area of the memory comprises a predetermined diagnosis area which becomes a diagnostic object, and a non diagnosis area except for the diagnostic object which is not used in the application and the memory fault diagnosis; the diagnosis area is divided into a plurality of Row areas in which the respective areas do not overlap to each other, and each of the Row areas is divided into a plurality of Cell areas in which the respective areas do not overlap to each other, and the Cell area is configured to have any size of a data bus width size, a byte size, a word size, and sizes of integral multiples of the byte size and the word size of the memory; and the Row area size is set not less than an integral multiple of the Cell area size and not more than ½ of the diagnosis area, and is set to a size in which a time of the diagnosis in a Row area becomes equal to a time of the diagnosis between Row areas; the memory fault diagnostic method comprising operating a computer to perform: a diagnostic step in a Row area to diagnose with respect to all the combinations of a set of Cell areas in the Row area; and a diagnostic step between Row areas to diagnose with respect to all the combinations of a set of the Row areas in the diagnosis area; wherein the diagnostic step in a Row area comprises: a step to save data of a predetermined set of Cell areas to the non diagnosis area at a timing when the execution of the application ends in the control cycle; a step, with respect to a set of the Cell areas, to write and generate four kinds of combinations of different two patterns in which patterns at the same bit position are in the inversion relation, to read out data of the relevant Cell areas, each time data is written, and to compare the values of the relevant Cell areas and expectation values of the relevant Cell areas to thereby determine whether or not these value are the relevant expectation values; a step to write back the data which has been saved in the non diagnosis area to a set of the Cell areas, in case that, as a result of comparison, these values are the expectation values; and a step to determine that the relevant set of Cell areas are in “fault” in case that, as a result of comparison, these values are not the expectation values; and wherein the diagnostic step between Row areas comprises: a step to save data of a predetermined set of Row areas to the non diagnosis area at a timing when the execution of the application ends in the control cycle; a step, with respect to a set of the Row areas, to write and generate four kinds of combinations of different two patterns in which patterns at the same bit position are in the inversion relation, to read out data of the relevant Row areas, each time data is written, and to compare the read out values of a set of the relevant Row areas with expectation values of the relevant Row areas to thereby determine whether or not these value are the relevant expectation values; a step to write back the data which has been saved in the non diagnosis area to a set of the Row areas, in case that, as a result of comparison, these values are the expectation values; and a step to determine that the relevant set of Row areas are in “fault” in case that, as a result of comparison, these values are not the expectation values.
地址 Tokyo JP