| 摘要 |
<p>An ion trap mass spectrometer according to an embodiment of the present invention comprises: an electron emission source; an ion trap which stores ions ionized through a collision with electrons emitted from the electron emission source; a secondary ion filter which blocks secondary ions by the ions selectively emitted from the ion trap; an ion detector which detects the ions selectively emitted from the ion trap, wherein the electron emission source, the ion trap, the secondary ion filter, and the ion detector are coaxially arranged, and the ion trap and the secondary ion filter form a quadrupole. According to the present invention, the ion trap mass spectrometer can meter a pure mass spectrum by excluding secondary ions which cause a background noise signal in a process of detecting ions.</p> |
