发明名称 Scattering Detection from Downhole Optical Spectra
摘要 Obtaining in-situ, at a first time, first optical spectral data associated with a formation fluid flowing through a downhole formation fluid sampling apparatus, and then obtaining in-situ, at a second time after the first time, second optical spectral data associated with the formation fluid flowing through the downhole formation fluid sampling apparatus. A wavelength-independent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus is then determined based on the first and second optical spectral data, and a wavelength-dependent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus is determined based on the first and second optical spectral data.
申请公布号 US2014150545(A1) 申请公布日期 2014.06.05
申请号 US201213693782 申请日期 2012.12.04
申请人 SCHLUMBERGER TECHNOLOGY CORPORATION 发明人 Hsu Kai;Indo Kentaro;Pop Julian
分类号 E21B49/10 主分类号 E21B49/10
代理机构 代理人
主权项 1. A method, comprising: obtaining in-situ, at a first time, first optical spectral data associated with a formation fluid flowing through a downhole formation fluid sampling apparatus; obtaining in-situ, at a second time after the first time, second optical spectral data associated with the formation fluid flowing through the downhole formation fluid sampling apparatus; determining a wavelength-independent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus based on the first and second optical spectral data; and determining a wavelength-dependent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus based on the first and second optical spectral data.
地址 Sugar Land TX US