发明名称 |
Scattering Detection from Downhole Optical Spectra |
摘要 |
Obtaining in-situ, at a first time, first optical spectral data associated with a formation fluid flowing through a downhole formation fluid sampling apparatus, and then obtaining in-situ, at a second time after the first time, second optical spectral data associated with the formation fluid flowing through the downhole formation fluid sampling apparatus. A wavelength-independent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus is then determined based on the first and second optical spectral data, and a wavelength-dependent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus is determined based on the first and second optical spectral data. |
申请公布号 |
US2014150545(A1) |
申请公布日期 |
2014.06.05 |
申请号 |
US201213693782 |
申请日期 |
2012.12.04 |
申请人 |
SCHLUMBERGER TECHNOLOGY CORPORATION |
发明人 |
Hsu Kai;Indo Kentaro;Pop Julian |
分类号 |
E21B49/10 |
主分类号 |
E21B49/10 |
代理机构 |
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代理人 |
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主权项 |
1. A method, comprising:
obtaining in-situ, at a first time, first optical spectral data associated with a formation fluid flowing through a downhole formation fluid sampling apparatus; obtaining in-situ, at a second time after the first time, second optical spectral data associated with the formation fluid flowing through the downhole formation fluid sampling apparatus; determining a wavelength-independent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus based on the first and second optical spectral data; and determining a wavelength-dependent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus based on the first and second optical spectral data.
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地址 |
Sugar Land TX US |