发明名称 REMAINING LIFE ASSESSMENT PROBE AND MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a remaining life assessment probe enabling a surface resistance measurement on a certain condition and thereby obtaining reliable measurement data.SOLUTION: The probe to diagnose life expectancy of an insulating material has a first electrode, a second electrode, and an elastic member. While the first electrode is in contact with a surface of an object, the second electrode is in contact with the surface, and brings a test voltage with the first electrode. The elastic member specifies pressure where the first electrode and the second electrode touch on the surface of the object.
申请公布号 JP2014102193(A) 申请公布日期 2014.06.05
申请号 JP20120255302 申请日期 2012.11.21
申请人 TOSHIBA CORP 发明人 MURAYAMA KIYOKO;TODO YOKO;KINOSHITA SUSUMU;TAKEI YOSHIHIRO;OTAKE SHIRO;OGAWA TOSHIAKI;NAKAJIMA WATARU;KUNITAKE AKIHIRO
分类号 G01N17/00;G01N27/04;G01R1/073 主分类号 G01N17/00
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