METHOD FOR TESTING AN INTEGRATED CIRCUIT

摘要

A method for testing an integrated circuit and an integrated circuit. The integrated circuit has an internal testing structure which may be accessed via an internal test access port and a control bus which is conducted to the outside via control ports, it being possible to switch over between a running mode and a test mode so that, in the test mode, the test access port is accessed via the control ports and the control bus, thus testing the integrated circuit.