发明名称 LOW FREQUENCY IMPEDANCE MEASUREMENT WITH SOURCE MEASURE UNITS
摘要 A method for measuring the impedance of a DUT having a capacitance of less than 1 pF includes applying a voltage or current signal to the DUT, the voltage or current signal including an AC component having a non-zero frequency of less than 1 kHz; monitoring a current or voltage signal, respectively, through the DUT in response to the voltage or current signal; digitizing the voltage signal and the current signal synchronously; and calculating the impedance from the digitized voltage and current signals.
申请公布号 US2014145729(A1) 申请公布日期 2014.05.29
申请号 US201113214693 申请日期 2011.08.22
申请人 SOBOLEWSKI GREGORY;KEITHLEY INSTRUMENTS, INC. 发明人 SOBOLEWSKI GREGORY
分类号 G01R27/28 主分类号 G01R27/28
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