| 发明名称 |
METHOD FOR INSPECTING ELECTRONIC DEVICE AND ELECTRONIC DEVICE INSPECTION APPARATUS |
| 摘要 |
A method for inspecting an electronic device, in which inspection of electrical characteristics is carried out, uses conduction to pass a current to an electronic device while the electronic device is being continuously conveyed. |
| 申请公布号 |
US2014139253(A1) |
申请公布日期 |
2014.05.22 |
| 申请号 |
US201214125562 |
申请日期 |
2012.05.23 |
| 申请人 |
ARITA HIROAKI;MASUDA OSAMU;KONICA MINOLTA, INC. |
发明人 |
ARITA HIROAKI;MASUDA OSAMU |
| 分类号 |
G01R1/02 |
主分类号 |
G01R1/02 |
| 代理机构 |
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代理人 |
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