发明名称 INSULATED GATE BIPOLAR TRANSISTOR
摘要 There is provided an insulated gate bipolar transistor including: a first semiconductor area of a first conductivity type; a second semiconductor area of a second conductivity type formed on one surface of the first semiconductor area; third semiconductor areas of the first conductivity type continuously formed in a length direction on one surface of the second semiconductor area; a plurality of trenches formed between the third semiconductor areas, extending to an inside of the second semiconductor area, and being continuous in the length direction; a fourth semiconductor area of the second conductivity type formed on one surface of the third semiconductor areas, insulation layers formed inside the trenches; gate electrodes buried inside the insulation layers; and a barrier layer formed in at least one of locations corresponding to the third semiconductor areas inside the second semiconductor area.
申请公布号 US2014138736(A1) 申请公布日期 2014.05.22
申请号 US201313751916 申请日期 2013.01.28
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 PARK JAEHOON;JANG CHANG SU;SONG IN HYUK;UM KEE JU;SEO DONG SOO
分类号 H01L29/739 主分类号 H01L29/739
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