发明名称 PHASE CHANGE MEMORY DEVICES AND METHODS FOR FABRICATING THE SAME
摘要 <p>The present invention relates to a phase change memory device and a manufacturing method thereof. The phase change memory device comprises memory cells provided to intersecting points between word lines extended in a first direction and bit lines extended in a second direction crossing the first direction; and a mold film provided between the memory cells and having air gaps which separate the memory cells. The memory cell includes a lower electrode which is electrically connected to the word line and has a first width in the first direction, an upper electrode which is electrically connected to the bit line and has a second width larger than the first width in the first direction, and a phase change film which is provided between the lower electrode and the upper electrode and has the first width in the first direction.</p>
申请公布号 KR20140059401(A) 申请公布日期 2014.05.16
申请号 KR20120125824 申请日期 2012.11.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH, GYU HWAN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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