发明名称 |
METHOD AND APPARATUS FOR PERFORMING STATE RETENTION FOR AT LEAST ONE FUNCTIONAL BLOCK WITHIN AN IC DEVICE |
摘要 |
<p>A method of performing state retention, for example during power gating, for at least one functional block within an integrated circuit device. The method comprises enabling at least one scan chain within the at least one functional block, scanning out a set of scan chain values from the at least one scan chain, a subset of the set of scan chain values comprising validation values, and writing the set of scan chain values to at least one memory element. The method further comprises retrieving the set of scan chain values from the at least one memory element, and validating the validation values within the retrieved set of scan chain values.</p> |
申请公布号 |
WO2014072770(A1) |
申请公布日期 |
2014.05.15 |
申请号 |
WO2012IB56239 |
申请日期 |
2012.11.07 |
申请人 |
FREESCALE SEMICONDUCTOR, INC.;PRIEL, MICHAEL;KUZMIN, DAN;SOFER, SERGEY |
发明人 |
PRIEL, MICHAEL;KUZMIN, DAN;SOFER, SERGEY |
分类号 |
G11C5/14;G11C7/10 |
主分类号 |
G11C5/14 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|