| 摘要 |
The present invention relates to a burn-in socket for a test and, more specifically, to a burn-in socket for the test comprising: a socket base fixed on an inspection circuit board and in which a base hole is formed at the center; a medium member connected to the terminal of the inspection circuit board in an insertion state within the base hole; a cover member slidingly combined on the socket base and including a cover hole connected to the base hole; a floating member inserted into the cover hole of the cover member and for slidingly mounting the inspected device between a first location connected to the medium member and a second location separately arranged from the medium member; and a ratchet unit for releasing or fixing the location of the inspected device mounted in the floating member along the rising or dropping of the cover member in the burn-in socket for the test for electrically connecting an inspected device to the inspection circuit board. |
