发明名称 SENSE AMPLIFIER SOFT-FAIL DETECTION CIRCUIT
摘要 Embodiments of a sense amplifier test circuit are disclosed that may allow for detecting soft failures. The sense amplifier test circuit may include a voltage generator circuit, a sense amplifier, and a detection circuit. The voltage generator may be operable to controllably supply different differential voltages to the sense amplifier, and the detection circuit may be operable to detect an analog voltage on the output of the sense amplifier.
申请公布号 US2014126312(A1) 申请公布日期 2014.05.08
申请号 US201213670813 申请日期 2012.11.07
申请人 APPLE INC. 发明人 HESS GREG M.;BURNETTE, II JAMES E.
分类号 H03F3/45;G01R31/316;G11C29/00 主分类号 H03F3/45
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