发明名称 Semiconductor overlapped PN structure and manufacturing method thereof
摘要 The present invention discloses a semiconductor overlapped PN structure and manufacturing method thereof. The method includes: providing a substrate; providing a first mask to define a P (or N) type well and at least one overlapped region in the substrate; implanting P (or N) type impurities into the P (or N) type well and the at least one overlapped region; providing a second mask having at least one opening to define an N (or P) type well in the substrate, and to define at least one dual-implanted region in the at least one overlapped region; implanting N (or P) type impurities into the N (or P) type well and the at least one dual-implanted region such that the at least one dual-implanted region has P type and N type impurities.
申请公布号 US8710633(B2) 申请公布日期 2014.04.29
申请号 US201313864196 申请日期 2013.04.16
申请人 HUANG TSUNG-YI;HUANG CHIEN-HAO;LIN YING-SHIOU;RICHTEK TECHNOLOGY CORPORATION 发明人 HUANG TSUNG-YI;HUANG CHIEN-HAO;LIN YING-SHIOU
分类号 H01L29/06 主分类号 H01L29/06
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