发明名称 Method of optical proximity correction in combination with double patterning technique
摘要 A method of optical proximity correction (OPC) includes the following steps. A layout pattern is provided to a computer system, and the layout pattern is classified into at least a first sub-layout pattern and at least a second sub-layout pattern. Then, at least an OPC calculation is performed respectively on the first sub-layout pattern and the second sub-layout pattern to form a corrected first sub-layout pattern and a corrected second sub-layout pattern. The corrected first sub-layout pattern/the corrected second sub-layout pattern and the layout pattern are compared to select a part of the corrected first sub-layout pattern/the corrected second sub-layout pattern as a first selected pattern/the second selected pattern, and the first selected pattern/the second selected pattern is further altered to modify the corrected first sub-layout pattern/the corrected second sub-layout pattern as a third sub-layout pattern/a fourth sub-layout pattern.
申请公布号 US8701052(B1) 申请公布日期 2014.04.15
申请号 US201313748564 申请日期 2013.01.23
申请人 UNITED MICROELECTRONICS CORP. 发明人 KUO HUI-FANG;CHEN MING-JUI;WANG CHENG-TE
分类号 G06F17/50 主分类号 G06F17/50
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