发明名称 Three-dimensional measurement apparatus and control method therefor
摘要 A three-dimensional measurement apparatus generates patterns to be projected onto the measurement object, images the measurement object using an imaging unit after projecting a plurality of types of generated patterns onto the measurement object using a projection unit, and computes the coordinate values of patterns on a captured image acquired by the imaging unit, based on the projected patterns, a geometric model of the measurement object, and information indicating the coarse position and orientation of the measurement object. Captured patterns on the captured image are corresponded with the patterns projected by the projection unit using the computed coordinate values, and the distances between the imaging unit and the patterns projected onto the measurement object are derived. The position and orientation of the measurement object are estimated using the derived distances and the geometric model of the measurement object, and the information on the coarse position and orientation is updated.
申请公布号 US8687057(B2) 申请公布日期 2014.04.01
申请号 US20100977031 申请日期 2010.12.22
申请人 KOBAYASHI KAZUHIKO;UCHIYAMA SHINJI;CANON KABUSHIKI KAISHA 发明人 KOBAYASHI KAZUHIKO;UCHIYAMA SHINJI
分类号 H04N15/00;H04N7/18;H04N9/47;H04N13/00 主分类号 H04N15/00
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