发明名称 SYSTEM AND METHOD OF TESTING HIGH BRIGHTNESS LED (HBLED)
摘要 A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (DUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences; a Parametric Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED; and a controller for coordinating timing of acquiring the set of measured HBLED parameters. In another embodiment, a photodetector is implemented to measure the integrated power of the optical output of the HBLED.
申请公布号 US2014088910(A1) 申请公布日期 2014.03.27
申请号 US201314089252 申请日期 2013.11.25
申请人 SOF-TEK INTEGRATORS, INC. DBA OP-TEST 发明人 MORROW DANIEL CREIGHTON;DUMMER JONATHAN LEIGH
分类号 G01R31/26 主分类号 G01R31/26
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